In-Line Characterization of Solar Cells by Excitation Photoluminescence

Authors

Kyle H. Montgomery, Mark S. Lundstrom, and Jerry M. Woodall

Publication

TECHCON, Austin, TX, 2011.

Download

Poster (pdf)
Copyright notice: This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author’s copyright. These works may not be reposted without the explicit permission of the copyright holder.

Abstract

In characterizing solar cells, the quantum efficiency is often used for more detailed understanding of behavior in the device compared to light I-V. Typically, quantum efficiency is measured after complete fabrication of a cell due to the need for making electrical contact to the device. However, an alternative is to observe the band-edge luminescence generated by photo-excited carriers as varying energies. This optical approach, known as excitation photoluminescence (PLE), presents a viable method for in-line characterization of solar cells, prior to metallization. The use of PLE as an in-line characterization tool is seldom used due to the typical need for multiple laser-based sources. However, with the advent of high-brightness LEDs with narrow spectral output and high output power, the benefit of PLE can now be more easily exploited, as this research seeks to explore. Our initial work describes the application to GaAs materials and solar cells in p-n junction and Schottky-based devices.

Keywords

solar, characterization, in-line metrology, photoluminescence, spectroscopy.

DOI

Citation

K. H. Montgomery, M. S. Lundstrom, and J. M. Woodall. “In-Line Characterization of Solar Cells by Excitation Photoluminescence.” presented at TECHCON 2011, Austin, TX, 2011.